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Cybersteel Inc.
376-293 City Road, Suite 600
San Francisco, CA 94102

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+44 1234 567 890

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About us

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VIS and NIR hyperspectral cameras

Wavelength ranges: VIS, NIR, SWIR

A strip in the camera’s field of view is illuminated and an imaging spectrograph produces high-resolution spectral and spatial images through its sensors. This technique is also known as push-broom technology. Figure 1 illustrates how it works:

1. The remitted light of the illuminated strip is imaged through a lens onto the entrance slit of the spectrometer.
2. A mirror illuminates the optical grating.
3. The optical grating splits the light into its wavelengths.
4. A second mirror capable of spectral resolution images the entrance slit onto an image sensor.
5. The spectra of all points along the illuminated strip are imaged onto the sensor. The result is a two-dimensional image of the intensity over location and wavelength.

Due to their significant effect on performance, some technical points are worth mentioning:

Short focal length,
Corrected NIR lenses:
large field of view
ZEISS optics &
Offner setup:
high-quality spectra
High-performance
image sensor:
high spatial and spectral resolution, large dynamic range,
high measurement repetition rate
Optimised elektronics: measurement of extremely fast objects,
high throughput

Fig. 1: Principle of the Offner setup and data processing.
Fig. 2: Principle of our camera in operation.

Product Techn. Data Applications

Multiplexed NIR spectrometer

Wavelength ranges: NIR/SWIR

A strip in the camera’s field of view is illuminated and imaged onto optical fibres arranged in a row. This technique is also called push broom technology. Figure 1 illustrates how it works:

1. The remitted light of the illuminated strip is imaged onto a rotating mirror with an NIR light fibre cable for each location point.
2. This mirror sequentially images the light of all optical fibres onto the entrance slit of the spectrometer.
3. The optical grating diffracts the light and images it onto a spectral line sensor.
4. The location points are then measured one after the other.

Due to their significant effect on performance, some technical points are worth mentioning:

Independent optical fibres: simultaneous measurement on multiple conveyors
ZEISS optics: high spectral resolution, high measurement sensitivity

Fig. 1: Beam path in multiplexer

Products Techn. Data Applications

 

RGB colour line scan camera

Wavelength range: VIS

A strip in the camera’s field of view is illuminated. This technique is also called push broom technology. The beam path is shown in Figure 1 as an example. It works in the following way:

1. The reflected light of the illuminated strip is imaged onto a sensor with a colour filter in a Bayer pattern applied to it.
2. The RGB information is detected from these signals.

Due to their significant effect on performance, some technical points are worth mentioning:

Optimised electronics: measurement of extremely fast objects,
hight throughput
CMOS sensor & ZEISS optics: high image contrast, low noise

Fig. 1: Principle of camera in operation mode.

Product Techn. Data Applications

Echelle spectrometer

Wavelength range: UV/VIS

A single point is imaged onto the entrance slit of a spectrograph by means of a single measuring head (optical fibre). Figure 1 illustrates how this works:

1. The sample emits light created by being exposed to short-focused laser pulses (also called LIBS).
2. This light enters the Echelle spectrograph via an optical fibre and a double-slit configuration.
3. An optical grating (Echelle grating) and a prism are used to image the different diffraction orders of the spectrum onto the image sensor.

Due to their significant effect on performance, some technical points are worth mentioning:

DSI optics:
(wavelength dispersive height
of entrance slit)
simultaneous use of UV and VIS ranges,
outstanding performance in the UV range,
extremely low crosstalk between grating
orders compared to other Echelle
spectrographs.
ZEISS Optics: high spectral resolution, very good imaging
quality
Complete system: (spectrograph,
camera and electronics)
easy and safe setup
ICCD camera excellent temporal resolution with precisely
adjustable and very short exposure time,
important precondition for the application
of calibration-free LIBS (CFLIBS)

Fig. 1: Principle LLA Echelle spectrometer in operation mode

Product Techn. Data Applications

 

X-ray fluorescence spectrometer

Wavelength range: X-ray/UV

A strip in the field of view is illuminated, this technique is also called push-and-broom technology.

1. The primary beam, emitted by an X-ray tube, excites the atoms in the irradiated material, which emit fluorescence radiation.
2. The resulting fluorescence is element-specific and measured by means of energy-dispersive detectors.
3. The analysis of the spectra measured in this way allows to identify and determine the elements in the material.

Due to their significant effect on performance, some technical points are worth mentioning:

Water-cooled, high
power X-ray tube
High primary radiation intensity produces
high fluorescence radiation intensity
Silicon drift detectors
of the latest generation
High count rates and best-possible energy resolution
Complete system
(tube, detector and
electronics)
Fast and detailed identification
of alloys, not only the main elements


Fig. 1: Functionality of X-ray fluorescence analysis
Fig. 2: Schematic diagram of our XRF spectrometer in operation
Fig. 3: Generation of X-ray fluorescence radiation

Products Techn. Data Applications

 

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